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Scanning Electron Microscopy (SEM) Concepts
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A note about the coating layer: a coating layer will help to avoid charging when working with non-conductive or semi-conductive samples. Please carefully consider if going to higher voltages is appropriate for your sample.
There are additional critical concepts to consider when operating an SEM that are not covered in this video, including: dwell time, pixel resolution, how to achieve a good signal-to-noise ratio image/measurement, and how some of these parameters can effect image resolution. These concepts are explained in detail in the book by Goldstein et al 'Scanning Electron Microscopy and X-Ray Microanalysis'.
A complimentary video will be made to discuss additional important concepts and considerations when changing the working distance (i.e. uneven samples, signal collection efficiency), to highlight the limitations when working with different sample types.
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Presented by Matthew Sullivan Hunt, PhD
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Disclaimer: This video is intended to serve as supplemental information and cannot replace in-person instrument training. Caltech and KNI are not responsible for how the presented information is translated for use in other facilities.
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