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Particle Detection and Identification | OPUS | FT-IR Software
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In our OPUS feature highlight series, we take a look at the integration of the particle identification and detection functionality Cluster ID into OPUS. With this smart feature users can find and analyze any type of particle. In this example we show the analysis of microplastics.
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More about OPUS IR:
More about our FT-IR Microscopes:
More about our FT-IR and Raman Microscopes:
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