Correlative Microscopy with OIM Analysis

Electron backscatter diffraction (EBSD) has become a well-established microanalysis technique for characterizing the crystallographic microstructure of materials. Traditionally, complementary chemical information has been collected simultaneously with the EBSD data via Energy Dispersive Spectroscopy (EDS). Combining the structural and chemical information provides a more-complete measurement and helps improve phase differentiation performance. Because this data is collected simultaneously, the data is spatially correlated for easy analysis. The drive to correlate EBSD data with other characterization techniques has increased. In this webinar we will demonstrate new features, which have been introduced into OIM Analysis™ to allow other sources of spatially-resolved data to be imported into the software. Examples of this data would include: Electron Beam Induced Current (EBIC); Cathodoluminescence (CL); Wavelength Dispersive Spectroscopy (WDS); Nanoindentation. We will also show routines, which have been added to spatially correlate this input data with the EBSD data. This allows users to gain new insight into their materials by exploring the relationship between the crystallographic microstructure and these other signals.