Combining structure and chemistry from cm to atoms: EBSD combined with EDS and APT

In this joint EDAX-CAMECA webinar the use of chemical information collected together with EBSD microstructural data is reviewed. Combined analysis may be performed from the cm- to nm- scale in the scanning electron microscope. The availability of simultaneously collected EDS data ensures successful EBSD analysis of multiphase materials and identification of particles. For even higher resolution data, EBSD may be paired with atom probe tomography. There it can both be used to pinpoint the exact volume of material to be analysed with atom probe tomography and also to provide the microstructural framework to interpret APT data once it is collected.