Measurement Challenges arising from New SemiconductorMaterials (...) | Dr. Alain Diebold | 2018NSSUS

Title: Measurement Challenges arising from New Semiconductor Materials and Structures for Integrated Circuits
Speaker: Dr. Alain Diebold, SUNY Polytechnic Institute

NanoScientific Conferences are venues for nanoscience researchers, scientists, and engineers to learn about the latest studies being formed using SPM. It is held annually in several countries around the world, and is a forum for researchers to share information with SPM and AFM users.

Dr. Alain Diebold, Interim Dean of the College of Nanoscale Science,
Empire Innovation Professor of Nanoscale Science, SUNY Polytechnic Institute;
Executive Director, Center for Nanoscale Metrology