Advanced Data Processing - Selection, Validation, Quantification

Electron Backscatter Diffraction (EBSD) is a standard tool for material science research. It has become synonymous with nice images such as Image Quality, IPF, grain size, and many other types of maps, charts, and plots which can be easily created in the OIM Analysis™ Software and contain a wealth of information. Such visualizations are very useful to obtain an overall representation of a sample. Still, in many cases, full-field analyses may also contain averaged properties from different microstructural components that need to be separated. For example, in an analysis of partially recrystallized materials, the orientation distribution of both the deformed and recrystallized fractions will get merged, which may hamper the analysis of microstructural evolution. OIM Analysis has powerful routines to generate subsets or partitions from a full dataset that allows for detailed analysis of customizable selections of a dataset. Another point of attention is the reliability of orientation measurements. The EDAX indexing algorithm actively verifies if multiple orientations are possible and warns if datapoints are ambiguous and need to be corrected or removed. Beyond all the visualization and analytical capabilities, all information ranging from raw orientation data to the number of neighboring grains and texture coefficients can be accessed and exported for further processing. And in the latest version of OIM Analysis, the analytical capabilities have been expanded even more with the implementation of full pattern analysis, dynamic pattern simulations with dictionary indexing, and parent grain reconstruction. In this webinar, the capabilities and workflow of the OIM Analysis software will be presented.