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ZEISS 3D Electron Microscopy for Materials Research
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ZEISS Crossbeam FIB-SEM and ORION NanoFab: Your tools for nanotomography, nanopatterning and nanofabrication. Highest throughput, highest 3D resolution and always a maximum of information from your samples.
#ZEISS #ElectronMicroscopy #3DImaging
#ZEISS #ElectronMicroscopy #3DImaging
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