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12' Wafer scanning Atomic Force Microscope- Large stage semiconductor inspection tool
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The AFM is designed for fully addressable wafer measurement of up to 200mm in size.Already used in many industrial and scientific applications
Simplifieds sample analysis to a trivial optimization and adjustment AFM parameters Step and Image AFM- tool for 3'4'6'8'12 wafers
Simplifieds sample analysis to a trivial optimization and adjustment AFM parameters Step and Image AFM- tool for 3'4'6'8'12 wafers
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