Webinar: Integrated Probe Card Solutions for Magnetic Testing

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We discuss combining GMW’s expertise in Electromagnets & Magnetic Modeling with Celadon expertise in Probe Cards & Testing for complete integrated solutions compatible with all Probers. The fully integrated probe card is typically used for on-wafer parametric tests, modeling, characterization and wafer level reliability as well as functional tests.

Speakers:
Tom King, PhD | Lead Magnet Scientist | GMW Associates
Karen Armendariz | CEO | Celadon Systems
Bill Funk | Chief Technical Officer | Celadon Systems

For more information, see:

GMW Associates

Celadon Systems
  1. GMW Associates
  2. spintronics
  3. electromagnets
  4. probe cards
  5. probe stations
  6. celadon
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