55 Ghz Wafer Test Probe Card for 5G mmWave devices

One of the most demanding test applications today is high volume production wafer test of 5G mmWave devices at speed. In this presentation Peter Cockburn discusses how mmWave interfaces operating at 55 GHz require impedance matching to 35 Ohms. RF simulation of the complete probe head and PCB signal paths was used to define a new design that met expected performance goals. Implementation required a new probe-head cross section with a custom ground probe and modified PCB trace structures on surface and embedded layers.

SWTest June 2022