Hot TDR - TDR and Return Loss Measurement of Tx and Rx devices under actual operating conditions

Keysight E5071C-TDR Enhanced Time Domain Analysis

Check out the latest release of its ENA Option TDR application software, Revision A.01.50. The enhanced software is designed to meet the requirements of the latest high-speed digital standards used in R&D, quality assurance and manufacturing test.

[Key Features & Specifications ]

- Real time measurements simultaneously in time domain (TDR/TDT) and frequency domain (S-parameters)
- Simple operations with intuitive user interface
- Eye diagram tests without external bit pattern generator
- E-xcellent ESD Robustness for reduction of maintenance cost
- Advanced waveform analysis with emphasis, equalization and jitter insertion features
- Impedance analysis of active devices under actual operating conditions with Hot TDR measurement capability

[About ENA Option TDR]

The ENA Option TDR application software is the ideal one-box solution for high-speed serial interconnect analysis. The ENA Option TDR includes three breakthrough features: simple and intuitive operation, fast and accurate measurements, and ESD robustness. The one-box solution is used by signal integrity engineers who require efficient design and verification in R&D, quality assurance and manufacturing.

[New Features of Revsion A.01.50]

The enhanced Keysight software delivers the following updates for high-speed digital measurements, enabling users to:

- Determine optimal signal conditioning for high-speed digital link with emphasis and equalization features. Simulate emphasis and equalization via a simple GUI.
- Perform stressed eye diagram analysis of interconnects with the jitter insertion feature. Impairments such as random and periodic (sinusoidal) jitter can be configured.
- Analyze impedance of active devices under actual operating conditions with Hot TDR measurement capability. The spurious frequencies of the transmitter can be determined from the data rate (user input) and avoided during the frequency sweep, allowing for fast and accurate measurements.

With the increase of bit rate, impedance matching becomes more critical, and the interface of active devices should be evaluated quantitatively. Hot TDR and Hot Return Loss measurement are the most suitable measurements for this purpose and provide new insight for signal integrity issues. ENA Option TDR brings a lot of advantages over traditional TDR oscilloscopes with the strengths of VNA based solution.