How McElhanney have integrated SLAM technology into their topographical survey workflow

Join Noah Eckhous as he delves into the world of advanced topographical surveying techniques with Chris Gilling, Terrestrial Scanning Division Manager at McElhanney, during @GeoWeek 2024 in Denver!

In this interview, Chris shares his experiences and insights into the recent acquisition of NavVis VLX 3 by McElhanney and how it's transforming their approach to creating detailed topographies and floor plans. Learn about the challenges and triumphs of integrating NavVis VLX 3 into their workflow, from conducting extensive urban corridor surveys to enhancing efficiency in the field. Chris discusses the precision and versatility of the device, comparing its performance with traditional methods and other high-tech equipment in various project environments.

Discover the strategic benefits of deploying NavVis VLX 3 in process industry work, its impact on project timelines, and the ease of use that facilitates training and operation by survey teams. This video is a must-watch for professionals interested in the latest developments in SLAM technology and its application in modern surveying and mapping projects.

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#BuildBetterReality #Surveying

[mattrenkert]

This is outstanding. We have enjoyed using the VLX 3 and have experienced the same responses from clients regarding the speed with which we can scan a site and deliver the models.