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Introduction to Transmission Electron Microscopy (TEM)
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The Materials Characterization Lab: Introduction to Transmission Electron Microscopy (TEM)
In a transmission electron microscope (TEM), a thin electron beam transparent specimen (ideally ≤ 100 nm) is exposed to a high-energy (typically 60 - 300 keV) electron beam. Images generally contain contrast that may be due to differences in crystallinity, atomic mass, or thickness variations within the sample. Crystallographic information can also be obtained from diffraction patterns.
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Materials Characterization Lab
Materials Characterization Techniques
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Penn State Materials Research Institute
In a transmission electron microscope (TEM), a thin electron beam transparent specimen (ideally ≤ 100 nm) is exposed to a high-energy (typically 60 - 300 keV) electron beam. Images generally contain contrast that may be due to differences in crystallinity, atomic mass, or thickness variations within the sample. Crystallographic information can also be obtained from diffraction patterns.
Subscribe to the Penn State MRI channel for more videos:
YouTube Playlist for the MCL Characterization Techniques Series:
Materials Characterization Lab
Materials Characterization Techniques
FOLLOW US:
LinkedIn: /in/PennStateMRI
YouTube: /c/PennStateMRI
Instagram: @PennStateMRI
Twitter: @PennStateMRI
Penn State Materials Research Institute
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