Все публикации

0:01:00

Celine Jacqueroud - Bioarcheology & Paleopathology #canadian #ccem#research #electronmicroscopy

0:01:00

Bavley Guerguis - APT for Semiconductor Research #canadian #ccem#research #apt #electronmicroscopy

0:00:59

Babafemi Agboola - Optoelectronic Properties of 2D Materials #ccem #canadian #electronmicroscopy

0:01:00

Vaytiere Iglesias - Automotive Metals #ccem #canadian#electronmicroscopy #research #engineering

0:00:53

Xiaozhang Yao - Protein Exchange Memory Features #ccem #canadian#research #electronmicroscopy

0:01:00

Peter Neathway - Plasmonics Research #ccem #canadian #research #electronmicroscopy #engineering

0:01:00

Dileep Ramachandran - Automotive Industry #canadian #ccem #electronmicroscopy #research

1:01:35

CCEM Webinar Series - Advancing your TEM analysis with TFS Spectra Ultra

0:00:57

Sarah Bowie - Dating Ore Deposits #ccem #electronmicroscopy #canadian #geology #research

0:00:59

Nathan Mullins - Wastewater Management #ccem #electronmicroscopy #canadian #research #engineering

0:00:53

Ella Gemin - Sharpie Conductivity #ccem #canadian #electronmicroscopy #research #highschool

0:00:58

Caleb Whittier - Optoelectronics #ccem #electronmicroscopy #canadian #research #engineering

0:00:59

Adib Salandari Rabori - Automotive Industry User #ccem #canadian #electronmicroscopy #research

0:01:00

Alessandra Merlo - Genetic Modification Research #ccem #canadian #electronmicroscopy #research

0:00:52

Happy Holidays from CCEM 2023

0:33:16

CCEM Webinar Series - Correlative APT - TEM at CCEM

2:00:18

Image Processing Tutorial- Session 5: Fourier Space and Relation to Sampling

1:08:04

CCEM Webinar Series- LaserFIB: Introduction and Applications

0:55:39

CCEM Webinar Series: Introduction to Helium Ion Microscopy

1:20:02

Image Processing Tutorial: Session4 - Image registration, and feature tracking

0:55:11

CCEM Webinar Series: New Thermo Fisher Quattro S ESEM

1:11:30

CCEM Webinar Series - Characterizing interfacial Segregation by APT and Auger

0:52:13

CCEM Webinar Series - Semiconductor Characterization using Atom Probe Tomography (APT)

0:03:16

Table Top SEM Hitachi TM4000Plus - Image Acquisition and Analysis