ISTFA Tools of the Trade 2015: Mentor Graphics

Watch as Geir Eide from Mentor Graphics describes how to dramatically reduce the yield and failure analysis cycle time and focus your failure analysis resources on the most relevant defects using Mentor Graphics systems. This was part of the 2015 ISTFA Tools of the Trade Tour.

PRODUCT: Tessent Diagnosis

PRODUCT DESCRIPTION: The Tessent Diagnosis software accelerates defect identification in digital semiconductor devices. The new cell-aware technology enables diagnosis at transistor level, which is critical for FinFET technologies. Failure analysis engineers will now know in advance what to look for in PFA.

OVERVIEW OF DEMONSTRATION: Attendees will be introduced to the diagnosis flow and see how Tessent Diagnosis software can be used to identify several types of defects in digital semiconductor devices based on design and failure data. The focus will be on the new transistor level (cell-aware) capability.