Cross Section by Focused Electron Beam (FIB) Microscope

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Cross Section performed on Focused Electon Beam (FIB) microscope at the University of Kentucky's Electron Microscopy Center.

This Focused Ion Beam Scanning Electron Microscope (FIB SEM) was acquired and installed at the University of Kentucky using funds from the Kentucky NSF EPSCoR program. This is the first FIB SEM device even installed in the state of Kentucky. This unique instrument greatly bolsters the research infrastructure of the commonwealth.

Video Credit: Nicolas Briot
Electron Microscopy Center
University of Kentucky
859-218-6504
  1. KY NSF EPSCoR
  2. Focused Ion Beam
  3. Physics (Field Of Study)
  4. Microscope (Invention)
  5. University Of Kentucky (College/University)
  6. EPSCoR
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