XS sample mounting for Ilion II and PECS II systems

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Procedure that outlines best practices for adhering electron microscopy samples onto the Ilion II or PECS II mounting jig prior to initiating the argon ion milling process.
  1. Gatan
  2. Gatan
  3. electron
  4. microscopy
  5. www.gatan.com
  6. ion milling
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XS sample mounting for Ilion II and PECS II systems

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Alignment Sample Insertion with the PECS II

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Model 1080 PicoMill® TEM specimen preparation system

[Materials] Cross-sectional SEM 0:00:22

[Materials] Cross-sectional SEM of charged LIB (Lithium Ion Battery) negative electrode

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Gatan 691 PIPS 0:03:41

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[Electronics] Multiple cross-section 0:01:29

[Electronics] Multiple cross-section preparation by BIB (Broad Ion Beam) milling

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Lamella alignment on the PIPS II system

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Capturing, Processing, and 0:07:12

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[Materials] Cooling Ion 0:00:42

[Materials] Cooling Ion Milling of Hollow Fiber with/without Ionic Liquid

VACGEN | Rotary 0:05:50

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Lamella recipe for the PIPS II system

Gatan 691 Polisher 0:02:41

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PHI 5600 System 0:03:07

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Gatan 691 Inv# 0:05:34

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